NIST and SEMI, a global industry association serving the manufacturing supply chains for the microelectronic, display and photovoltaic industries, are hosting an event called the Product Authentication Information Management Workshop Feb. 17-18 in Gaithersburg, Md.
On the agenda are sessions on criminal enforcement of phony integrated circuits and a presentation by a University of Maryland researcher on the limitations of product inspection as an authentication method.
The event’s objective is stated as:
To enable secure integration and interoperability among stakeholders in industry and government with information on genuine products, suspect parts, and counterfeiters. The workshop will be a forum to gather input from expert stakeholders on:
- Issues, challenges, requirements and priorities
- Types of information needed throughout the product lifecycle for:
- Authenticating products, components, materials
- Taking action on suspect parts and counterfeiters
- Actionable plan to enable exchange of pertinent data for product authentication
